Hitachi High-Tech Analytical Science Expand X-Strata920 Capabilities With a High Resolution Detector
Where nanometers can make all the difference, advance XRF coating measurement in your operation with the X-Strata920 SDD version.
OXFORD, England, July 9, 2018 (Newswire.com) - Hitachi High-Tech Analytical Science Corporation (Hitachi High-Tech Analytical Science), a Hitachi High-Technologies Corporation (TSE: 8036) wholly owned subsidiary engaged in the manufacture and sales of analysis and measuring instruments, today expands the capabilities of the established X-Strata920 XRF coatings analyzer to include a new high-resolution detector and a new sample stage configuration.
The Hitachi Hitch-Tech XRF Coatings range has successfully helped measure coating thickness in the electronics and general metal finishing industries for over 40 years. The X-Strata920 ensures coatings meet the required specifications and minimize waste from excess coating, or scrapping under-plated material. With the expansion of the X-Strata’s capabilities users are able to do much more with this instrument.
The X-Strata920, along with the other XRF instruments in the Hitachi High-Tech range, are known for being future proof, reliable and easy to use. The addition of an SDD and the option for a wide base gives our customers greater analytical capabilities and flexibility to measure complex coatings on a large range of parts. Our coatings products including the advanced FT150 microspot analyzer, handheld XRF, and CMI gauges that allow for quick portable analysis have been trusted for over 40 years to deliver coatings measurements and we are excited to offer these improvements.
Matt Kreiner, Hitachi Product Business Development Manager
This new X-Strata means the instrument can be customized for optimal performance, with options for a high-resolution silicon drift detector (SDD) or a proportional counter. In addition, it now has four chamber and base configurations to handle a large selection of sample shapes and sizes, including complex geometries found in the automotive industry.
An SDD can offer advantages over a proportional counter for complex coating structures, as it can more easily analyze elements that have similar XRF characteristics, such as nickel and copper. This extends the range of elements that can be analysed to include phosphorus – critical for electroless nickel analysis and can more precisely measure thin coatings, such as gold in the nanometer range when conforming to IPC-4552A.
Matt Kreiner, Hitachi Product Business Development Manager, said: “The X-Strata920, along with the other XRF instruments in the Hitachi High-Tech range, are known for being future proof, reliable and easy to use. The addition of an SDD and the option for a wide base gives our customers greater analytical capabilities and flexibility to measure complex coatings on a large range of parts. We have retained the highly intuitive SmartLink software so that any operator – regardless of experience level - can quickly learn to use the instrument and get accurate, reliable results. Our coatings products including the advanced FT150 microspot analyzer, handheld XRF, and CMI gauges that allow for quick, portable analysis have been trusted for over 40 years to deliver coatings measurements, and we are excited to offer these improvements."
Hitachi High-Tech Analytical Science website
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About Hitachi High-Technologies Corporation
Hitachi High-Technologies Corporation, headquartered in Tokyo, Japan, is engaged in activities in a broad range of fields, including Science and Medical Systems, Electronic Device Systems, Industrial Systems, and Advanced Industrial Products. The company's consolidated sales for FY 2017 were approx. JP687.7billion (USD6.3billion). For further information, visit http://www.hitachi-hightech.com/global/.
About Hitachi High-Tech Analytical Science Corporation
Hitachi High-Tech Analytical Science is a new global company created in July 2017 within the Hitachi High Technologies Group. The company is headquartered in Oxford, UK, with research and development and assembly operations in Finland, Germany, and China and sales and support operations in a number of countries around the world. Our product range includes:
- FT series, X-Strata, and MAXXI microspot XRF analysers measure coating thickness of single- and multi-layer coatings including alloy layers and are designed to be incorporated into quality control or process control programmes, as well as research laboratories.
- Lab-X5000 and X-Supreme8000 benchtop XRF analysers deliver quality assurance and process control across a diverse range of industries such as petroleum, wood treatment, cement, minerals, mining and plastics.
- Our PMI-MASTER, FOUNDRY-MASTER and TEST-MASTER range of analysers are used by industries the world over for fast and precise metals analysis. Featuring optical emission spectroscopy technology, all important elements with low detection limits and high precision can be determined, including carbon in steel and all technically relevant main and trace elements in nearly all metals.
- X-MET8000 handheld analyzers, used by thousands of businesses to deliver simple, rapid and non-destructive analysis for alloy analysis, scrap metal sorting and metal grade screening using precision XRF technology.
- Vulcan handheld analyzers, with LIBS laser technology, identify metal alloys in just one second, making it one of the fastest analyzers in the world. This hugely benefits businesses processing high volumes of metal.
For Media Inquiries
Ashley-Kate McCann, Global Marketing Communications Manager
Hitachi High-Tech Analytical Science
Email: Ashley-Kate.McCANN@hitachi-hightech-as.com
Source: Hitachi High-Tech Analytical Science
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